首页> 外国专利> Projection lens for microlithographic projection illumination system for forming mask on light sensitive layer, has two compensation units arranged on different position along optical axis, where refractive lens are provided between units

Projection lens for microlithographic projection illumination system for forming mask on light sensitive layer, has two compensation units arranged on different position along optical axis, where refractive lens are provided between units

机译:用于在光敏层上形成掩模的微光刻投影照明系统的投影透镜具有沿光轴在不同位置布置的两个补偿单元,其中在两个单元之间设置了折射透镜

摘要

The projection lens (100) has refractive lenses (113-119, 131-140, 142-143) made of non-optical uniaxial material, where one of the lenses exhibits intrinsic birefringence. Two compensation units (111, 112, 141) are provided for the partial compensation of the intrinsic birefringence, where each compensation unit includes an optical uniaxial crystal material. The compensation units introduce no delay for a light that passes through an optical axis (OA). The compensation units are arranged on different position along the optical axis, where the refractive lens are provided between the units. An independent claim is also included for a method for microlithographic production of a micro-structured component.
机译:投影透镜(100)具有由非光学单轴材料制成的折射透镜(113-119、131-140、142-143),其中透镜之一表现出固有的双折射。提供两个补偿单元(111、112、141)用于部分补偿本征双折射,其中每个补偿单元包括光学单轴晶体材料。补偿单元不会对通过光轴(OA)的光造成延迟。补偿单元沿着光轴布置在不同的位置上,其中折射透镜设置在这些单元之间。还包括用于微光刻生产微结构部件的方法的独立权利要求。

著录项

  • 公开/公告号DE102008001761A1

    专利类型

  • 公开/公告日2008-12-11

    原文格式PDF

  • 申请/专利权人 CARL ZEISS SMT AG;

    申请/专利号DE20081001761

  • 发明设计人 DODOC AURELIAN;

    申请日2008-05-14

  • 分类号G02B17/08;G02B13/14;G03F7/20;

  • 国家 DE

  • 入库时间 2022-08-21 19:09:20

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