Material measure for optical position measuring unit, which operates with light of central wavelength, comprises substrate with two areas, which code position information, which is selected with light of wavelength

摘要

The material measure (4,5) comprises a substrate (9) with two areas. The two areas code a position information, which is selected with the light of a wavelength. The area of a lattice structure (7) comprises a period, which affects the optical characteristics of the material measure. The period of the lattice structure is smaller than the wavelength. An independent claim is included for an optical position measuring unit has a light source for linear polarized light of a central wavelength.