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Position-measuring system, having scanning units multiplexed to light sources and detectors, for optically scanning a measuring standard and method for operating such a position-measuring system

机译:位置测量系统和用于操作这种位置测量系统的方法,该位置测量系统具有与光源和检测器多路复用的扫描单元,用于光学扫描测量标准

摘要

A position-measuring system includes a plurality of scanning units for the optical scanning of at least one measuring standard, the scanning units being coupled optically to a plurality of light sources and a plurality of detectors. Disposed between the scanning units and the detectors are a plurality of demultiplexers, via which in each case at least two scanning units are coupled to one detector.
机译:位置测量系统包括用于光学地扫描至少一种测量标准的多个扫描单元,所述扫描单元光学地耦合到多个光源和多个检测器。在扫描单元和检测器之间设置有多个解复用器,通过该解复用器分别将至少两个扫描单元耦合到一个检测器。

著录项

  • 公开/公告号US9874434B2

    专利类型

  • 公开/公告日2018-01-23

    原文格式PDF

  • 申请/专利权人 DR. JOHANNES HEIDENHAIN GMBH;

    申请/专利号US201414565614

  • 发明设计人 WOLFGANG HOLZAPFEL;

    申请日2014-12-10

  • 分类号G01D5/36;G01B11/14;G01D5/26;

  • 国家 US

  • 入库时间 2022-08-21 12:56:18

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