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Technique in order to improve the efficiency of the transistor with the transistor specific contact design

机译:为了提高晶体管效率而采用晶体管特定触点设计的技术

摘要

Size of contact structure (230A and 230B) and/or by making density conform locally, for example, inside the individual transistor (210,210A and 210B), or, in a wider range, it is possible to improve the entire efficiency of the semiconductor device (200) of the high performance. Because of this, it can consider in interrelationship with contact structure (230A and 230B) and local device quality. On the one hand, the former process strategy it is possible to maintain high compatibility.
机译:接触结构(230A和230B)的大小和/或通过使密度局部一致,例如在单个晶体管(210,210A和210B)内部,或者在更宽的范围内,可以提高半导体的整体效率高性能的设备(200)。因此,可以考虑与接触结构(230A和230B)和本地设备质量之间的相互关系。一方面,前者的工艺策略有可能保持高度的兼容性。

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