首页> 外国专利> METHOD FOR ENHANCING POSITIVE (CLEAR FIELD) PHASE SHIFT MASK (TRANSPARENT PHASE SHIFT MASK WITH OPAQUE APERTURE) WITH BORDER REGIONS AROUND PHASE 0 REGION AND PHASE 180 REGIONS

METHOD FOR ENHANCING POSITIVE (CLEAR FIELD) PHASE SHIFT MASK (TRANSPARENT PHASE SHIFT MASK WITH OPAQUE APERTURE) WITH BORDER REGIONS AROUND PHASE 0 REGION AND PHASE 180 REGIONS

机译:在0相区和180相区的边界区域增强正(透明场)相移掩模(具有不透明孔径的透明相移掩模)的方法

摘要

PROBLEM TO BE SOLVED: To generate phase shifting patterns to improve patterning of gates and other layers, structures or regions needing sub-nominal dimensions.;SOLUTION: A technique is disclosed, in which a first boundary region is added to the ends of a phase zero (0) pattern defining polygons and a second boundary region is added to the ends of a phase 180 pattern. This technique can improve the line-end pattern definition and improve the manufacturability and a patterning process window. The added boundary region balances the light on both sides of the line ends, resulting in a more predictable final resist pattern.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:产生相移图案以改善需要亚标称尺寸的栅极和其他层,结构或区域的图案化;解决方案:公开了一种技术,其中将第一边界区域添加到相的末端定义多边形的零(0)图案和第二边界区域添加到相位180图案的末端。该技术可以改善线端图案的清晰度,并改善可制造性和图案化处理窗口。增加的边界区域使线端两侧的光线平衡,从而产生更可预测的最终抗蚀剂图案。;版权所有:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP2009288818A

    专利类型

  • 公开/公告日2009-12-10

    原文格式PDF

  • 申请/专利权人 ADVANCED MICRO DEVICES INC;

    申请/专利号JP20090211488

  • 发明设计人 SPENCE CHRISTOPHER A;LUKANC TODD P;

    申请日2009-09-14

  • 分类号G03F1/08;H01L21/027;

  • 国家 JP

  • 入库时间 2022-08-21 19:01:45

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