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And semiconductor inductor forming method of the semiconductor inductor (on-chip inductor design rules)

机译:半导体电感器和半导体电感器的形成方法(片上电感器设计规则)

摘要

And an on-chip inductor having an inductor Q values ​​are [Problems] improved semiconductor device of the sub-100 nm, to provide a program and method for manufacturing a device. SOLUTION: A specific width is disposed on the dielectric surface, is determined as a function of design rule checking rules each, height, spacing, and has a cross-sectional area, the parallel metal it is a plurality of spaced an inductor including a line is provided. Planarization process for a single rule, the metal density ratio of metal to the surface of the dielectric 20% 80% are determined and produced. In one embodiment, the sum of the separation gap between the metal lines is less than the sum of the height of the inner sidewall metal lines. In one embodiment, the height of the line width, and at least one of the line spacing dimension, but the yield of the chip, chip performance, manufacturability of the chip, and the parameters of one or more of the Q value of the inductor is chosen to optimize. [Selection Figure Figure 3
机译:并且具有电感器Q值的片上电感器是[问题]改进了100 nm以下的半导体器件,以提供用于制造器件的程序和方法。解决方案:在介电表面上设置特定宽度,该宽度根据设计规则检查规则确定,每个规则都包括高度,间距和横截面积,平行金属是多个隔开的感应器,包括一条线提供。对于单一规则的平面化过程,确定并生产出金属与电介质表面的金属密度比为80%的20%。在一实施例中,金属线之间的分隔间隙的总和小于内侧壁金属线的高度的总和。在一实施例中,线宽的高度和线间距尺寸中的至少一个,但是芯片的成品率,芯片性能,芯片的可制造性以及电感器的Q值中的一个或多个的参数选择进行优化。 [选择图图3

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