The sample drop substrates and the total reflection fluorescent x-ray analytical instruments and the total reflection fluorescent x-ray analysis mannered null liquid samples being

摘要

PPROBLEM TO BE SOLVED: To provide a specimen drip substrate for total reflection fluorescent X-ray analysis, a total reflection fluorescent X-ray analyzer, and a total reflection fluorescent X-ray analysis method, wherein a trace amount liquid sample is accurately made to dripped, in order to be dried onto a prescribed part of a sample drip substrate, and to improve the sensitivity and accuracy of total reflection fluorescent X-ray analysis on the liquid sample. PSOLUTION: This specimen drip substrate 15 for total reflection fluorescent X-ray analysis is a sample drip substrate for thereonto dripping and drying the liquid specimen, comprising a planar substrate 15K with its surface being hydrophobic and having planarity of mirror polishing level, and a synthetic resin drip dried trace 41, made by dripping a prescribed amount of synthetic resin solution 40 onto a prescribed part of a surface of the planar substrate 15K and drying it; the resin solution 40, obtained by dissolving a synthetic resin into a prescribed concentration by using a solvent. By using this total reflection fluorescent X-ray analyzer and its method, a sample solution 70 is dripped onto and dried on the dried trace 41 on the drip substrate 15, to perform total reflection fluorescent X-ray analysis. PCOPYRIGHT: (C)2008,JPO&INPIT