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Calibration method of the scattering body measuring device, and measuring a scattering medium apparatus using the same

机译:散射体测量装置的校准方法,以及使用该校准方法的散射介质装置的测量

摘要

PROBLEM TO BE SOLVED: To provide a calibration method of a scattered absorber measuring apparatus which enables easier execution of measurement for calibration and the calculation of an instrument function and the scattered absorber measuring apparatus using the same.;SOLUTION: As scattered absorber SM to be measured by the scattered absorber measuring apparatus, a scattered absorber for calibration with a known optical parameter is set and pulse light from a light source 20 is made incident from a light incidence position A through a light guide 40a for light incidence and the pulse light propagated scattering through the scattered absorber SM is detected by a photo detector 30 through a light guide 40b for detecting light from a light detection position B to perform a measurement for calibration. A measuring waveform obtained by a signal processing part 50 undergoes a comparison operation with a theoretical waveform by an instrument function calculating part 61 of an arithmetic processing part 60 to calculate the instrument function with a measuring apparatus itself. This facilitates the measurement for calibration and the calculation of the instrument function.;COPYRIGHT: (C)2002,JPO
机译:解决的问题:提供一种散射吸收剂测量装置的校准方法,该校准方法能够更容易地执行用于校准和仪器功能的测量的测量;以及使用该方法的散射吸收剂测量装置。在由散射吸收剂测量装置测量后,设置具有已知光学参数的用于校准的散射吸收剂,并使来自光源20的脉冲光通过光入射的光导40a从光入射位置A入射,并且使脉冲光传播。由光检测器30通过光导40b检测通过散射的吸收体SM的散射,该光导40b用于检测来自光检测位置B的光以进行校准测量。由信号处理部分50获得的测量波形通过算术处理部分60的仪器功能计算部分61与理论波形进行比较操作,以利用测量设备本身来计算仪器功能。这有助于进行校准的测量和仪器功能的计算。;版权所有:(C)2002,JPO

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