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Semiconductor wafer, semiconductor thin film, and method for manufacturing semiconductor thin film devices

机译:半导体晶片,半导体薄膜及其制造方法

摘要

A method for manufacturing a semiconductor thin film device includes: forming a buffer layer on an Si (111) substrate and a single crystal semiconductor layer on the buffer layer; forming an island including the semiconductor layer, buffer layer, and a portion of the substrate; forming a coating layer on the island; etching the substrate along its Si (111) plane to release the island from the substrate, the coating layer serving as a mask; and bonding the released island to another substrate, a released surface of the released island contacting the another substrate. A semiconductor device includes a single crystal semiconductor layer other than Si, which has a semiconductor device formed on a front surface of an Si (111) layer lying in a (111) plane. The layer is bonded to another substrate with a back surface contacting the another substrate or a bonding layer formed on the another substrate.
机译:一种用于制造半导体薄膜器件的方法,包括:在Si(111)衬底上形成缓冲层,并在该缓冲层上形成单晶半导体层;以及在该缓冲层上形成单晶半导体层。形成包括半导体层,缓冲层和衬底的一部分的岛;在岛上形成涂层;沿其Si(111)平面蚀刻衬底以从衬底释放岛,该涂层用作掩模;将释放的岛结合到另一衬底上,释放的岛的释放表面与另一衬底接触。半导体器件包括除Si之外的单晶半导体层,该单晶半导体层具有形成在位于(111)面的Si(111)层的前表面上的半导体器件。该层以与另一基板接触的背面或在另一基板上形成的接合层的方式接合至另一基板。

著录项

  • 公开/公告号US2010270562A1

    专利类型

  • 公开/公告日2010-10-28

    原文格式PDF

  • 申请/专利权人 MITSUHIKO OGIHARA;

    申请/专利号US20100662646

  • 发明设计人 MITSUHIKO OGIHARA;

    申请日2010-04-27

  • 分类号H01L29/205;H01L21/20;H01L29/24;

  • 国家 US

  • 入库时间 2022-08-21 18:55:55

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