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INFORMATION PROCESSING APPARATUS, VOLTAGE ACCEPTANCE TEST SYSTEM, AND VOLTAGE ACCEPTANCE TEST METHOD

机译:信息处理装置,电压验收测试系统和电压验收测试方法

摘要

An information processing apparatus including: a test program 2 that acquires a first voltage value which is a voltage value at which a target apparatus operates, allows the target apparatus to operate at the first voltage value, and determines an operating state of the target apparatus; a voltage change controller 12 that changes, in the case where a result of the determination is abnormal state, a voltage value difference which is a difference between a voltage value at the next stage and the first voltage value or a time difference so as to reduce the change rate obtained by dividing the voltage value difference by the time difference and outputs, when a time obtained by adding the time difference to the current time has come, a second voltage value obtained by adding or subtracting to/from the first voltage value to the test program 2 as the first voltage value.
机译:一种信息处理设备,包括:测试程序 2 ,其获取作为目标设备操作的电压值的第一电压值,允许目标设备以第一电压值操作,并确定目标设备的工作状态;电压改变控制器 12 ,在确定结果为异常状态的情况下,改变电压值差,该电压值差是下一级电压值与第一电压值之差,或者为了减小通过将电压值差除以时间差而获得的变化率而产生的时间差,并且在通过将时间差与当前时间相加而获得的时间到来时,输出通过将相加或相减得到的第二电压值。 /从第一电压值到测试程序 2 作为第一电压值。

著录项

  • 公开/公告号US2010063759A1

    专利类型

  • 公开/公告日2010-03-11

    原文格式PDF

  • 申请/专利权人 KIMIHIRO NISHIYAMA;

    申请/专利号US20090555852

  • 发明设计人 KIMIHIRO NISHIYAMA;

    申请日2009-09-09

  • 分类号G01R19/00;

  • 国家 US

  • 入库时间 2022-08-21 18:55:40

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