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Information processing apparatus, allowable voltage test system, allowable voltage test method

机译:信息处理设备,允许电压测试系统,允许电压测试方法

摘要

An information processing apparatus including: a test program 2 that acquires a first voltage value which is a voltage value at which a target apparatus operates, allows the target apparatus to operate at the first voltage value, and determines an operating state of the target apparatus; a voltage change controller 12 that changes, in the case where a result of the determination is abnormal state, a voltage value difference which is a difference between a voltage value at the next stage and the first voltage value or a time difference so as to reduce the change rate obtained by dividing the voltage value difference by the time difference and outputs, when a time obtained by adding the time difference to the current time has come, a second voltage value obtained by adding or subtracting to/from the first voltage value to the test program 2 as the first voltage value.
机译:一种信息处理设备,包括:测试程序2,其获取第一电压值,该第一电压值是目标设备操作的电压值,使目标设备以第一电压值操作,并确定目标设备的操作状态。电压改变控制器12,在确定的结果为异常状态的情况下,改变下一级的电压值与第一电压值之间的差或时间差的电压值差以减小通过将电压值差除以时间差而获得的变化率,并输出,当通过将时间差与当前时间相加而获得的时间到来时,通过对第一电压值加上或减去第一电压值而获得的第二电压值将测试程序2作为第一电压值。

著录项

  • 公开/公告号JP5332426B2

    专利类型

  • 公开/公告日2013-11-06

    原文格式PDF

  • 申请/专利权人 富士通株式会社;

    申请/专利号JP20080231801

  • 发明设计人 西山 公裕;

    申请日2008-09-10

  • 分类号G06F11/22;

  • 国家 JP

  • 入库时间 2022-08-21 16:55:56

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