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Inverse Lithography For High Transmission Attenuated Phase Shift Mask Design And Creation

机译:用于高透射率衰减型相移掩模的反光刻技术

摘要

Various implementations of the invention provide for generation of a high transmission phase shift mask layout through inverse lithography techniques. In various implementations of the present invention, a set of mask data having a plurality of pixels is generated. The transmission value associated with each pixel may then be determined through an inverse lithography technique. With various implementations of the invention, the inverse lithography technique identifies an objective function, minimizes the objective function in relation to a simulation of the optical lithographic process, such that the transmission value, which is greater than 6%, may be determined.
机译:本发明的各种实现方式通过逆光刻技术提供了高透射相移掩模布局的产生。在本发明的各种实施方式中,生成具有多个像素的一组掩模数据。然后可以通过反光刻技术确定与每个像素相关联的透射值。利用本发明的各种实施方式,逆光刻技术识别目标函数,相对于光学光刻过程的仿真最小化目标函数,使得可以确定大于6%的透射率值。

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