首页> 外国专利> IN-SITU MONITORING AND METHOD TO DETERMINE ACCUMULATED PRINTED WIRING BOARD THERMAL AND/OR VIBRATION STRESS FATIGUE USING A MIRRORED MONITOR CHIP AND CONTINUITY CIRCUIT

IN-SITU MONITORING AND METHOD TO DETERMINE ACCUMULATED PRINTED WIRING BOARD THERMAL AND/OR VIBRATION STRESS FATIGUE USING A MIRRORED MONITOR CHIP AND CONTINUITY CIRCUIT

机译:使用监控芯片和连续电路的原位监测和确定累积印刷线路板热和/或振动应力疲劳的方法

摘要

A monitoring system includes a monitor chip or chips soldered to a printed wiring board. By mirroring a function IC chip interface with the monitor chip, the consumed and remaining thermal/and or vibration-fatigue life of the function IC chip based on the life-environment actually experienced through monitoring of the monitor chip is readily determined. The monitor chip includes monitoring interconnections and/or circuitry which determines the number and/or location of failed-open solder terminations of the monitor chip.
机译:监视系统包括监视芯片或焊接到印刷线路板上的芯片。通过将功能IC芯片接口与监视芯片进行镜像,可以很容易地确定功能IC芯片的消耗和剩余的热/和/或振动疲劳寿命,该寿命基于通过监视监视芯片实际经历的寿命环境而定。监控器芯片包括监控互连和/或电路,该互连和/或电路确定监控器芯片的失效打开的焊料端子的数量和/或位置。

著录项

  • 公开/公告号US2010073022A1

    专利类型

  • 公开/公告日2010-03-25

    原文格式PDF

  • 申请/专利权人 TED R. SCHNETKER;

    申请/专利号US20090628276

  • 发明设计人 TED R. SCHNETKER;

    申请日2009-12-01

  • 分类号G01R31/26;

  • 国家 US

  • 入库时间 2022-08-21 18:54:08

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