首页> 外国专利> Cell of Semiconductor Device Having Sub-Wavelength-Sized Gate Electrode Conductive Structures Formed from Rectangular Shaped Gate Electrode Layout Features and At Least Eight Transistors

Cell of Semiconductor Device Having Sub-Wavelength-Sized Gate Electrode Conductive Structures Formed from Rectangular Shaped Gate Electrode Layout Features and At Least Eight Transistors

机译:具有矩形截面栅电极布局特征和至少八个晶体管形成的亚波长尺寸栅电极导电结构的半导体器件单元

摘要

A cell of a semiconductor device includes a substrate portion formed to include at least one p-type diffusion region and at least one n-type diffusion region separated by non-active regions. The cell includes a gate electrode level including a number of conductive features defined to extend in only a first parallel direction. Each of the conductive features within the gate electrode level is fabricated from a respective originating rectangular-shaped layout feature. A width of the conductive features is less than a wavelength of light used in a photolithography process for their fabrication. Some of the conductive features form respective PMOS and/or NMOS transistor devices. A total number of the PMOS and NMOS transistor devices in the cell is greater than or equal to eight. The cell also includes a number of interconnect levels formed above the gate electrode level.
机译:半导体装置的单元包括形成为包括由非活性区域隔开的至少一个p型扩散区域和至少一个n型扩散区域的基板部分。该单元包括栅电极层,该栅电极层包括被限定为仅在第一平行方向上延伸的多个导电特征。栅电极级内的每个导电特征均由各自的始发矩形布局特征制成。导电部件的宽度小于用于其制造的光刻工艺中使用的光的波长。一些导电特征形成相应的PMOS和/或NMOS晶体管器件。单元中的PMOS和NMOS晶体管器件的总数大于或等于八个。该单元还包括形成在栅电极水平上方的多个互连水平。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号