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Method to monitor substrate viability by a sensor mounted to a substrate

机译:通过安装在基板上的传感器监控基板生存能力的方法

摘要

Method for detecting and reporting a condition. The components of the invention include an electronic package having a substrate with electrically conducting lines electrically connected to an integrated chip, and to a source of voltage. The integrated circuit chip is mounted onto a substrate and electrically connected to at least one electrically conducting line. A sensor, combined with a signal generator, connected to the substrate, is operable to generate an electrical signal upon detection of a condition selected from a condition of the substrate and a condition of an electrical connection to the substrate. The signal generator, after immediately receiving the aforesaid electrical signal from the sensor, emits the warning signal. The warning signal of indicated of an existing defect or a condition which can lower the longevity of the total electronic package.
机译:用于检测和报告状况的方法。本发明的部件包括电子封装,该电子封装具有基板,该基板具有电连接至集成芯片和电压源的导电线。集成电路芯片被安装在基板上并且电连接至至少一条导电线。传感器,与信号发生器结合,连接到基板,在检测到从基板的状态和与基板的电连接的状态中选择的状态时,可产生电信号。信号发生器在立即从传感器接收到上述电信号之后,发出警告信号。警告信号表明存在可能会降低整个电子包装寿命的缺陷或状况。

著录项

  • 公开/公告号US7741834B2

    专利类型

  • 公开/公告日2010-06-22

    原文格式PDF

  • 申请/专利权人 HIEN DANG;SRI SRI-JAYANTHA;

    申请/专利号US20070835008

  • 发明设计人 HIEN DANG;SRI SRI-JAYANTHA;

    申请日2007-08-07

  • 分类号G01R31/26;

  • 国家 US

  • 入库时间 2022-08-21 18:49:52

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