首页>
外国专利>
Determining allowance antenna area as function of total gate insulator area for SOI technology
Determining allowance antenna area as function of total gate insulator area for SOI technology
展开▼
机译:确定SOI技术的允许天线面积与总栅极绝缘体面积的关系
展开▼
页面导航
摘要
著录项
相似文献
摘要
A method is disclosed of determining allowable antenna limits for semiconductor-on-insulator (SOI) technology. In one embodiment, the method may include: determining antenna area on a gate; determining antenna area on a source/drain; determining a total gate insulator area between gate and source/drain nets; and calculating allowable antenna area as a function of the total gate insulator area between the nets such that a larger total antenna area is allowed for larger total gate insulator area between the nets.
展开▼