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Vertical thin film transistor with short-channel effect suppression

机译:具有短沟道效应抑制的垂直薄膜晶体管

摘要

A vertical thin film transistor (TFT) structure allows for a channel length to be scaled down, below that allowed by lateral TFT structures, to nanoscale (i.e., below 100 nm). However, while reducing the channel length, short-channel effects have been found in previous VTFT structures. Aspects of the new vertical TFT structure allow for the suppression of some of the short-channel effects. Advantageously, the capability of defining nanoscale channel length with short-channel effect suppression allows for p-channel vertical TFTs, where previously these were impractical. Furthermore, in aspects of the vertical TFT structure, the gate electrode is entirely vertical and by eliminating the horizontal overlap of the gate electrode over the drain electrode that present in earlier vertical TFT structures, parasitic gate-to-drain capacitance is eliminated. The vertical TFT structure provides size advantages over lateral TFTs and, furthermore, allows a TFT to be built at the intersection of electrode lines in an active-matrix configuration.
机译:垂直薄膜晶体管(TFT)结构允许将沟道长度按比例缩小至纳米尺寸(即,小于100nm),该沟道长度小于横向TFT结构所允许的沟道长度。然而,在减小沟道长度的同时,在先前的VTFT结构中发现了短沟道效应。新的垂直TFT结构的各个方面可以抑制某些短沟道效应。有利的是,通过抑制短沟道效应来定义纳米级沟道长度的能力允许使用p沟道垂直TFT,而以前这些在当时是不切实际的。此外,在垂直TFT结构的各方面中,栅电极完全垂直,并且通过消除栅电极在较早的垂直TFT结构中存在的漏电极上的水平重叠,消除了寄生的栅漏电容。垂直TFT结构提供了优于横向TFT的尺寸优势,并且还允许以有源矩阵配置在电极线的交叉点处构建TFT。

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