Apparatus for diagnostics of reliability of semiconductor super-powerful pulse avalanche-transit diodes (ATD)

摘要

Apparatus for diagnostics of reliability of semiconductor super-powerful pulse avalanche-transit diodes (ATD) includes reading device, second coaxial delay line, former of nano-second pulses to which first coaxial delay line is connected. To the first coaxial delay line tee element is connected to which through matched loads inputs of the first and the second coaxial measuring delay lines are connected, to outputs of those matching loads are connected and in parallel with those to inputs of the second and the third coaxial lines reading device is connected, at that to the tee element fourth coaxial line with switch device is connected, it includes the structure under investigation.