首页> 外国专利> AN ION GAUGE, A MONITORING SYSTEM AND A METHOD FOR DETERMINING A TOTAL INTEGRATED CONCENTRATION OF SUBSTANCES HAVING SPECIFIC MOLECULAR WEIGHT IN A GAS SAMPLE

AN ION GAUGE, A MONITORING SYSTEM AND A METHOD FOR DETERMINING A TOTAL INTEGRATED CONCENTRATION OF SUBSTANCES HAVING SPECIFIC MOLECULAR WEIGHT IN A GAS SAMPLE

机译:离子规,监测系统和方法,用于确定气体样品中具有特定分子量的物质的总集成浓度

摘要

The invention relates to anion gauge10 for determining a total integrated concentration of a substance having a molecular weight falling into a pre-determined range of molecular weights in a gas sample, comprising an ionization region in a vicinity of the ionization source 1; an accelerator 2, 3, 4 for generating a flow of said ionized molecules I; a mass filter 8 for intercepting said flow for separating ions having the molecular weight falling into said range from said ionized molecules and a detector 7 for generating a signal representative of the total integrated concentration of such ions present in the gas sample. The invention further relates to a lithographic apparatus and a method for determining a total integrated concentration of a substance having a molecular weight falling into a pre-determined range of molecular weights in a gas sample.
机译:本发明涉及一种用于测定在气体样品中具有落入分子量的预定范围内的分子量的物质的总积分浓度的阴离子计10,其在电离源1附近包括电离区域。加速器2、3、4,用于产生所述离子化分子I的流;一个质量过滤器8和一个检测器7,该质量过滤器8截取上述流以从上述电离的分子中分离出分子量落入上述范围的离子,检测器7产生代表该气体样品中存在的这些离子的总积分浓度的信号。本发明还涉及一种用于确定气体样品中的分子量落入分子量的预定范围内的物质的总积分浓度的光刻设备和方法。

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