On-chip diagnosis method and on-chip diagnosis block for memory repair with mixed redundancy (IO redundancy and word-register redundancy)

摘要

An on chip diagnosis method for memory repair comprises the following steps: during a BIST (Built-In Self Test) run storing inside two arrays (fill_array, shift_array) on chip information for a final diagnosis to apply all redundancy resources needed, wherein the first array (fill_array) of said two arrays is used to keep a minimum error mapping, and the second of said two arrays (shift_array) is used to control the fill of the first one, and then performing the final diagnosis on chip based upon an analysis of said two arrays (fill_array, shift_array). An on chip diagnosis block for memory repair comprises word-register redundancy as external redundancy, and, internal redundancy, which internal redundancy is redundant IO (IOR) only.