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GaxIn1-xN SUBSTRATE AND GaxIn1-xN SUBSTRATE CLEANING METHOD

机译:GaxIn1-xN基板和GaxIn1-xN基板清洁方法

摘要

Affords GaxIn1-xN substrates onto which high-quality epitaxial films can be stably grown, and cleaning methods for manufacturing the GaxIn1-xN substrates.;GaxIn1-xN substrate in which the number of particles of not less than 0.2 µm particle size present on the GaxIn1-xN substrate surface is 20 or fewer, given that the GaxIn1-xN substrate diameter is 2 inches. Furthermore, a GaxIn1-xN substrate in which in a photoelectron spectrum along the GaxIn1-xN substrate surface by X-ray photoelectron spectroscopy at a take-off angle of 10°, the ratio between the peak areas of the C1s electron and N1s electron (C 1s electron peak area/N 1s electron peak area) is 3 or less.
机译:Affords Ga x In 1- x N衬底,可以在其上稳定生长高质量外延膜,并且Ga x In 1- x N衬底的清洗方法; GaxIn1-xN衬底,其中考虑到GaxIn1-xN基板直径为2英寸,存在于GaxIn1-xN基板表面上的不少于0.2 µm粒径的颗粒数为20以下。此外,在GaxIn1-xN基板中,通过X射线光电子能谱在沿GaxIn1-xN基板表面的光电子光谱中以10°的出射角,C1s电子和N1s电子的峰面积之比( C 1s电子峰面积/ N 1s电子峰面积)为3以下。

著录项

  • 公开/公告号EP2051288A4

    专利类型

  • 公开/公告日2010-03-24

    原文格式PDF

  • 申请/专利权人 SUMITOMO ELECTRIC INDUSTRIES LTD.;

    申请/专利号EP20070745330

  • 发明设计人 NAKAHATA HIDEAKI;UEMURA TOMOKI;

    申请日2007-06-15

  • 分类号B08B3/08;B08B3/12;C30B29/38;H01L21/02;H01L33/00;H01L33/32;

  • 国家 EP

  • 入库时间 2022-08-21 18:37:51

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