首页> 外国专利> DOUBLE PATTERNING METHOD FOR CREATING A REGULAR ARRAY OF PILLARS WITH DUAL SHALLOW TRENCH ISOLATION

DOUBLE PATTERNING METHOD FOR CREATING A REGULAR ARRAY OF PILLARS WITH DUAL SHALLOW TRENCH ISOLATION

机译:具有双重浅沟槽隔离的矩形柱的双重构图方法

摘要

A method is disclosed for forming vertical bipolar junction transistors including a regular array of base contact pillars and emitter contact pillars with a width below the minimum lithographical resolution F of the lithographic technique employed. In an embodiment, the pillar array features have a dimension of approximately F/2, though this dimension could be reduced down to other values compatible with embodiments of the invention. A storage element, such as a phase change storage element, can be formed above the regular array of base contact pillars and emitter contact pillars.
机译:公开了一种用于形成垂直双极结型晶体管的方法,该晶体管包括基极接触柱和发射极接触柱的规则阵列,其宽度低于所采用的光刻技术的最小光刻分辨率F。在一个实施例中,柱阵列特征具有大约F / 2的尺寸,尽管该尺寸可以减小到与本发明的实施例兼容的其他值。可以在基极接触柱和发射极接触柱的规则阵列上方形成诸如相变存储元件的存储元件。

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