首页> 外国专利> Apparatus of measuring the orientation relationship between neighbouring grains using a gonimeter in a transmission electron microscope and method for revealing the characteristics of grain boundaries

Apparatus of measuring the orientation relationship between neighbouring grains using a gonimeter in a transmission electron microscope and method for revealing the characteristics of grain boundaries

机译:在透射电子显微镜中使用测角仪测量相邻晶粒之间的取向关系的装置以及揭示晶界特征的方法

摘要

An apparatus and method for measuring the crystallographic orientation relationship of neighboring grains and the characteristics of grain boundaries using a goniometer of a transmission electron microscope are disclosed to check the orientation relationship between two crystals and the characteristics of grain boundaries with a small error in real time. An apparatus for measuring the orientation relationship between neighboring grains and the characteristics of grain boundaries by using a goniometer of a transmission electron stereoscope, the apparatus comprising a goniometer mounted at a transmission electron microscope and a measurement unit for revealing the characteristics of grain boundaries of a specimen by linear-algebraically interpreting the relationship between crystal axes and tilt axes of the specimen using the goniometer.
机译:公开了一种使用透射电子显微镜的测角仪测量相邻晶粒的结晶取向关系和晶界特征的装置和方法,以实时地检查两个晶体之间的取向关系和晶界特征,且误差很小。 。一种通过使用透射电子立体镜的测角仪来测量相邻晶粒之间的取向关系和晶界特征的装置,该装置包括安装在透射电子显微镜上的测角仪和用于显示硅的晶界特征的测量单元。通过使用测角仪线性代数解释标本的晶体轴和倾斜轴之间的关系来对标本进行校准。

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