Grain Boundary Characterization of Nanocrystalline Cu from the Stereological Analysis of Transmission Electron Microscope Orientation Maps

著录项

• 来源
  《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》|2011年|1416-1417|共2页
• 会议地点 Nashville TN(US)
• 作者

  A. Darbal; K. J. Ganesh; K. Barmak; G. S. Rohrer; P. J. Ferreira; T. Sun; K. R.rnCoffey;

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• 作者单位

  Materials Research Science and Engineering Center and the Department of Materials Science andrnEngineering, Carnegie Mellon University, 5000 Forbes Avenue, Pittsburgh, PA 15213;

  rnMaterials Science and Engineering, The University of Texas at Austin, 1 University Station,rnAustin, TX 78712;

  rnMaterials Research Science and Engineering Center and the Department of Materials Science andrnEngineering, Carnegie Mellon University, 5000 Forbes Avenue, Pittsburgh, PA 15213;

  rnMaterials Research Science and Engineering Center and the Department of Materials Science andrnEngineering, Carnegie Mellon University, 5000 Forbes Avenue, Pittsburgh, PA 15213;

  rnMaterials Science and Engineering, The University of Texas at Austin, 1 University Station,rnAustin, TX 78712;

  rnAdvanced Materials Processing and Analysis Center, University of Central Florida, 4000rnCentral Florida Boulevard, Orlando, FL 32816;

  rnAdvanced Materials Processing and Analysis Center, University of Central Florida, 4000rnCentral Florida Boulevard, Orlando, FL 32816;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类
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• 入库时间 2022-08-26 14:04:25