首页> 外国专利> ALL AROUND GATE-TYPE SEMICONDUCTOR DEVICE FOR IMPROVING THE MOBILITY OF AN ELECTRONICS AND A HOLE IN A CHANNEL BY IMPROVING THE STRUCTURE OF A VERTICAL CHANNEL AND A MANUFACTURING METHOD THEREOF

ALL AROUND GATE-TYPE SEMICONDUCTOR DEVICE FOR IMPROVING THE MOBILITY OF AN ELECTRONICS AND A HOLE IN A CHANNEL BY IMPROVING THE STRUCTURE OF A VERTICAL CHANNEL AND A MANUFACTURING METHOD THEREOF

机译:通过改善垂直通道的结构及其制造方法来改善通道中的电子和孔的移动性的全门型半导体器件

摘要

PURPOSE: An all around gate-type semiconductor device and a manufacturing method thereof are provided to improve a current supply capability by improving a short channel effect and a mobility of an electronics and a hole.;CONSTITUTION: A drain contact(21), a source contact(22) and a gate contact(23) are formed on the top of an insulating layer(20). The drain contact is connected to a silicon-germanium post(13) or a silicon-germanium post and a silicon layer(14). The source contact is touched with the silicon layer by etching insulating layers(20,16). The source contact is separated from the gate electrode(19) by the insulating layer. The gate contact is connected to the gate electrode. The gate electrode surrounds the vertical type channel including the silicon-germanium post.;COPYRIGHT KIPO 2010
机译:目的:提供一种全栅型半导体器件及其制造方法,以通过改善短沟道效应以及电子器件和空穴的迁移率来提高电流供应能力。构成:漏极触点(21),在绝缘层(20)的顶部上形成源极接触(22)和栅极接触(23)。漏极触点连接到硅锗柱(13)或硅锗柱和硅层(14)。通过蚀刻绝缘层(20,16)使源极接触与硅层接触。源极接触通过绝缘层与栅电极(19)分开。栅极触点连接到栅电极。栅电极围绕包括硅锗柱的垂直型沟道。; COPYRIGHT KIPO 2010

著录项

  • 公开/公告号KR20100011559A

    专利类型

  • 公开/公告日2010-02-03

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20080072824

  • 发明设计人 JANG TAE SU;

    申请日2008-07-25

  • 分类号H01L21/336;H01L29/78;

  • 国家 KR

  • 入库时间 2022-08-21 18:33:28

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