首页> 外国专利> FABRICATION METHOD OF A THIN FILM DEVICE, CAPABLE OF MINIMIZING THE CHANGE OF DEVICE CHARACTERISTICS BY A LASER RADIATION

FABRICATION METHOD OF A THIN FILM DEVICE, CAPABLE OF MINIMIZING THE CHANGE OF DEVICE CHARACTERISTICS BY A LASER RADIATION

机译:薄膜器件的制造方法,能够最小化激光辐射引起的器件特性变化

摘要

PURPOSE: A fabrication method of a thin film device is provided to allow a user to remove a process of removing residue of a sacrificial layer by providing a junction layer of a thin film and a permanent substrate as an exfoliated film.;CONSTITUTION: In a fabrication method of a thin film device, a sacrificial layer is partly removed by using a dry etching process. The sacrificial layer(13') keeps at least thin film device on the first substrate. A supporting structure(17) is boned on at least one thin film device temporally. The at least one thin film device which is bonded on the supporting structure is separated from the first substrate. A sacrificial layer left behind is removed. The at least one thin film device is bonded on the second substrate(21). The support structure is separated from the at least one thin film device.;COPYRIGHT KIPO 2010
机译:目的:提供一种薄膜器件的制造方法,以允许用户通过提供薄膜与永久性基底的结合层作为剥离膜来去除去除牺牲层残留物的过程。在薄膜器件的制造方法中,通过使用干蚀刻工艺来部分地去除牺牲层。牺牲层(13')至少将薄膜器件保持在第一基板上。支撑结构(17)在时间上至少固定在一个薄膜装置上。结合在支撑结构上的至少一个薄膜装置与第一基板分离。留下的牺牲层被去除。至少一个薄膜装置被接合在第二基板(21)上。支撑结构与至少一个薄膜设备分开。; COPYRIGHT KIPO 2010

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