首页> 外国专利> SEMICONDUCTOR DEVICE, CAPABLE OF IMPROVING THE MINIATURIZATION AND THE INTEGRATION OF THE SEMICONDUCTOR DEVICE, AND A METHOD FOR MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE, CAPABLE OF IMPROVING THE MINIATURIZATION AND THE INTEGRATION OF THE SEMICONDUCTOR DEVICE, AND A METHOD FOR MANUFACTURING THE SAME

机译:具有改善半导体装置的微型化和集成化的能力的半导体装置及其制造方法

摘要

PURPOSE: A semiconductor device and a method for manufacturing the same are provided to reduce the size of a gate resistance by forming a gate electrode with copper metal.;CONSTITUTION: A low doped drain(LDD) region(120) is formed on a semiconductor substrate(100). A salicide(140) is formed on the upper side of the LDD region. A gate electrode(180) is formed on the semiconductor substrate. The gate electrode includes a gate oxide film(181) and a metal layer(183). An insulating layer(170) is formed on the upper side of the semiconductor substrate and the lateral direction of the gate electrode.;COPYRIGHT KIPO 2010
机译:目的:提供一种半导体器件及其制造方法,以通过用铜金属形成栅电极来减小栅极电阻的大小。;组成:在半导体上形成低掺杂漏极(LDD)区域(120)基板(100)。在LDD区域的上侧形成自对准硅化物(140)。在半导体衬底上形成栅电极(180)。栅电极包括栅氧化膜(181)和金属层(183)。在半导体衬底的上侧和栅电极的横向方向上形成绝缘层(170)。COPYRIGHTKIPO 2010

著录项

  • 公开/公告号KR20100059189A

    专利类型

  • 公开/公告日2010-06-04

    原文格式PDF

  • 申请/专利权人 DONGBU HITEK CO. LTD.;

    申请/专利号KR20080117873

  • 发明设计人 KIM DO HUN;

    申请日2008-11-26

  • 分类号H01L29/78;H01L21/336;

  • 国家 KR

  • 入库时间 2022-08-21 18:32:38

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