MEMORY SYSTEM, A MEMORY TEST SYSTEM, AND A TESTING METHOD THEREOF, CAPABLE OF REDUCING TIME AND COSTS FOR TEST

摘要

PURPOSE: A memory system, a memory test system, and a testing method thereof are provided to maintain the quality of a clock signal by optically splitting the clock signal.;CONSTITUTION: A memory test system comprises a system memory(MEM1,MEM2), a tester(120), and an optical splitting module(140). The tester generates a clock signal and a test signal for testing the memory. The optical splitting module includes an electro-optic signal converter(142), an optical signal splitter(144), and an optic-electro signal converter(146). The electro-optic signal converter outputs an optical clock signal and an optical test signal by converting the clock signal and the test signal into an optical signal. The optical signal splitter splits the optical test signal and the optical test signal into n signals. The optic-electric signal converter converts the split optical clock signal and test signal into the electric signal used in the memory.;COPYRIGHT KIPO 2010