首页> 外国专利> FABRICATION METHOD OF POLYCRYSTALLINE SILICON AND ATOMIC DEPOSITION APPARATUS THEREOF, CAPABLE OF MINIMIZING THE PROPERTY DISTRIBUTION OF THIN FILM TRANSISTOR

FABRICATION METHOD OF POLYCRYSTALLINE SILICON AND ATOMIC DEPOSITION APPARATUS THEREOF, CAPABLE OF MINIMIZING THE PROPERTY DISTRIBUTION OF THIN FILM TRANSISTOR

机译:结晶硅的制备方法及其原子沉积装置,可最小化薄膜晶体管的性能分布

摘要

PURPOSE: A fabrication method of polycrystalline silicon and an atomic deposition apparatus thereof are provided to control the formation position of a seed and the size of grain by forming the crystallization guiding metal at a predetermined position and uniform concentration.;CONSTITUTION: A buffer layer(110) is formed on a substrate(100). An amorphous silicon layer(120) is formed on the buffer layer. A mask(130) equipped with the opening and closing is located on the amorphous silicon layer. A UV lamp(140) is positioned on the mask. The crystallization induction metal is formed on the amorphous silicon layer.;COPYRIGHT KIPO 2011
机译:目的:提供一种多晶硅的制造方法及其原子沉积设备,以通过在预定位置和均匀浓度下形成结晶引导金属来控制晶种的形成位置和晶粒尺寸。组成:缓冲层( 110)形成在基板(100)上。在缓冲层上形成非晶硅层(120)。配备有打开和关闭的掩模(130)位于非晶硅层上。将紫外线灯(140)放在面罩上。在非晶硅层上形成结晶诱导金属。; COPYRIGHT KIPO 2011

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