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PROBE FOR A GEOMETRY-MEASURING APPARATUS AND A GEOMETRY-MEASURING APPARATUS WHICH CAN DETECT THE MEASURED SURFACE OF AN ARBITRARY SHAPE AT THE LOW SIDE ENERGY
PROBE FOR A GEOMETRY-MEASURING APPARATUS AND A GEOMETRY-MEASURING APPARATUS WHICH CAN DETECT THE MEASURED SURFACE OF AN ARBITRARY SHAPE AT THE LOW SIDE ENERGY
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机译:可以测量低边能量的任意形状的被测表面的几何测量装置和几何测量装置的探头
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摘要
PURPOSE: A probe for a geometry-measuring apparatus and a geometry-measuring apparatus which can detect the measured surface of an arbitrary shape at the low side energy are provided to measure a shape similar to a horizontal plane.;CONSTITUTION: A probe for a geometry-measuring apparatus comprises an attach part(2), a straight moving part(6), a shaking part(3) and a connecting device(4). The attach part is attached to a geometry-measuring apparatus(201). The straight moving part is supported about the attach part in the gravity direction. The shaking part comprises an arm including a stylus(121) contacting with a test side(61) of a measurement object(60) in the leading edge. The connecting device supports the shaking part in the straight moving part. The connecting device comprises support and loader.;COPYRIGHT KIPO 2011
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