首页> 外国专利> PROBE FOR A GEOMETRY-MEASURING APPARATUS AND A GEOMETRY-MEASURING APPARATUS WHICH CAN DETECT THE MEASURED SURFACE OF AN ARBITRARY SHAPE AT THE LOW SIDE ENERGY

PROBE FOR A GEOMETRY-MEASURING APPARATUS AND A GEOMETRY-MEASURING APPARATUS WHICH CAN DETECT THE MEASURED SURFACE OF AN ARBITRARY SHAPE AT THE LOW SIDE ENERGY

机译:可以测量低边能量的任意形状的被测表面的几何测量装置和几何测量装置的探头

摘要

PURPOSE: A probe for a geometry-measuring apparatus and a geometry-measuring apparatus which can detect the measured surface of an arbitrary shape at the low side energy are provided to measure a shape similar to a horizontal plane.;CONSTITUTION: A probe for a geometry-measuring apparatus comprises an attach part(2), a straight moving part(6), a shaking part(3) and a connecting device(4). The attach part is attached to a geometry-measuring apparatus(201). The straight moving part is supported about the attach part in the gravity direction. The shaking part comprises an arm including a stylus(121) contacting with a test side(61) of a measurement object(60) in the leading edge. The connecting device supports the shaking part in the straight moving part. The connecting device comprises support and loader.;COPYRIGHT KIPO 2011
机译:目的:提供一种用于几何测量设备的探头和一种可以在低侧能量下检测任意形状的被测表面的几何测量设备,以测量类似于水平面的形状。几何测量装置包括附接部(2),直线运动部(6),摇动部(3)和连接装置(4)。附接部附接到几何测量设备(201)。笔直移动部在重力方向上围绕附接部被支撑。摇动部分包括具有触针(121)的臂,该触针(121)在前缘中与测量对象(60)的测试侧(61)接触。连接装置将摇动部分支撑在笔直的移动部分中。连接设备包括支架和装载器。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20100103394A

    专利类型

  • 公开/公告日2010-09-27

    原文格式PDF

  • 申请/专利权人 PANASONIC CORPORATION;

    申请/专利号KR20100021644

  • 发明设计人 HATTA KENICHIRO;FUNABASHI TAKANORI;

    申请日2010-03-11

  • 分类号G01B5/016;G01B5/20;G01B11/14;G01B11/26;

  • 国家 KR

  • 入库时间 2022-08-21 18:31:55

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