首页> 外国专利> METHOD AND APPARATUS FOR MICRO-JET ENABLED, LOW ENERGY ION GENERATION AND TRANSPORT IN PLASMA PROCESSING

METHOD AND APPARATUS FOR MICRO-JET ENABLED, LOW ENERGY ION GENERATION AND TRANSPORT IN PLASMA PROCESSING

机译:等离子体处理中实现微射流,低能离子产生和传输的方法和装置

摘要

I for use in plasma processing of a semiconductor wafer, a method of generating and transferring the energy ion disclosed There. In an exemplary embodiment of the invention, the method includes generating a plasma from a gas species to generate plasma exhaust gas. Next, the exhaust gas is introduced into the plasma processing chamber for receiving a wafer. Ion content of the plasma when the plasma is generated, the exhaust gas is discharged to the inside of the first being inserted into the process chamber, it is improved by activating an additional ion source. Next, the primary plasma discharge is directed by a control panel assembly, through the control panel assembly to produce a secondary plasma discharge exiting. 2, the strength of the electric field applied to the ions contained in the primary plasma discharge is reduced. According to this manner, the electric field intensity is reduced to the ions impact the wafer with an energy insufficient to cause damage to semiconductor devices formed on the wafer.
机译:本发明公开了一种用于半导体晶片的等离子体处理中的产生和转移能量离子的方法。在本发明的示例性实施例中,该方法包括从气体物种产生等离子体以产生等离子体废气。接下来,将废气引入等离子体处理室中以接收晶片。当产生等离子体时,等离子体中的离子含量较高,废气先被排放到处理室内,然后通过激活附加的离子源来改善。接下来,初级等离子体放电由控制面板组件引导,穿过控制面板组件以产生次级等离子体放电。如图2所示,施加到一次等离子体放电中包含的离子的电场强度降低。按照这种方式,电场强度减小,离子以足以不足以损坏形成在晶片上的半导体器件的能量冲击晶片。

著录项

  • 公开/公告号KR100971559B1

    专利类型

  • 公开/公告日2010-07-20

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20037017255

  • 申请日2002-07-12

  • 分类号H01L21/3065;

  • 国家 KR

  • 入库时间 2022-08-21 18:31:00

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