METHOD FOR DIAGNOSTIC NONDESTRUCTIVE TESTING (DNT) OF ERASABLE PROGRAMMABLE LOGIC DEVICE OF FOREIGN MANUFACTURE (EPLD FM)

摘要

FIELD: information technologies.;SUBSTANCE: method for diagnostic nondestructive testing (DNT) of erasable programmable logic device of foreign manufacture (EPLD FM), including the following stages: measurement of EPLD FM current consumption in various stationary conditions, at least twice, and results of measurements are saved in two-dimensional array; calculation of current consumption difference between neighbouring stationary states for each EPLD FM, and calculation results are saved in other array with account of the sign; calculation of expectation values; mean square deviations of current consumption difference values are calculated; calculation of coefficient that characterise deviation of current consumption difference values from expectation value of differences in current consumption, comparison of calculated coefficients value with values of coefficients for appropriate volume of sampling, and results of comparison are used to identify reliability of microchip.;EFFECT: invention makes it possible to identify reliability of EPLD FM, which is assessed by variation in current consumption in process of change over from one stationary state into another one with account of sign.;1 dwg, 1 tbl