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A method for measuring the variable parameters of more gates with 2 - port - network analysers and corresponding measuring device

机译:用2端口网络分析仪和相应的测量装置测量更多门的可变参数的方法。

摘要

A method for measuring the variable parameters of a more gate (32) with m gates (331, 332, 333, .. 33n) with a calibration which are capable of 2 - port - network analyzer (31), where m is greater than 2,in each case two gates (331, 332) the more gate (32) with the two gates (341, 342) of the network analyzer (31) for carrying out of two port circuit - measurements and the remaining not be connected to the network analyzer (31) is connected to the gates (333, 334, .. 33n) the more gate (32) with external connections (353, 354, .. 35n) be wired,successively passing through all of the m · (m – 1) / 2 two port circuit - measurements are carried out and the external terminals (351, 352, 353, .. 35n) at the respective gates (331, 332, 333, .. 33n) for the various measurements in each case are selected to be the same,as an external terminals (35.1, 352, 353, .. 35n) to the impedance of the gates (331, 332, 333, .. 33n) the more gate (32) is not adapted, reflecting reflection be used closures,the influence of the reflection of the..
机译:一种用m个门(33 1 ,33 2 ,33 3 ,.....)测量更多门(32)的可变参数的方法33 n )并具有2端口网络分析仪(31)的校准能力,其中m大于2,在每种情况下,两个门(33 1 33 2 )与网络分析器(31)的两个门(34 1 ,34 2 )相连的更多门(32)两个端口电路中的一个-测量值,其余未连接到网络分析器(31)的连接到门(33 3 ,33 4 ,.. 33 < Sub> n )与外部连接(35 3 ,35 4 ,.. 35 n )的更多门(32)进行布线,成功通过所有m·(m – 1)/ 2两端口电路-进行测量并使用外部端子(35 1 ,35 2 ,35 3 ,.. 35 n )分别位于各个门(33 1 ,33 2 ,33 < Sub> 3 ,.. 33 n )for t与外部端子(35. 1 ,35 2 ,35 3 、. 35 n )到门的阻抗(33 1 ,33 2 ,33 3 ,.. 33 n )越不适合门(32),则反射反射将被关闭,影响反射。

著录项

  • 公开/公告号DE102005013583B4

    专利类型

  • 公开/公告日2010-04-29

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE20051013583

  • 发明设计人

    申请日2005-03-23

  • 分类号G01R27/28;G01R35/00;

  • 国家 DE

  • 入库时间 2022-08-21 18:29:06

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