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Photoconductive measuring tip, measuring setup and use of the photoconductive measuring tip and / or the measuring setup

机译:光电导测量头,测量装置以及光电导测量头和/或测量装置的使用

摘要

The invention relates to a photoconductive measuring tip for field detection of the electrical component of an electromagnetic field, with an arrangement of at least one carrier and a laterally extending on the carrier arranged, mutually insulated first electrode and second electrode, via a photoconductive material in the region of a photoconductive gap a lateral end structure of the first and second electrodes, non-wavelength-adjusted with respect to a wavelength of the electrical component of the electro-magnetic field to be detected, and at least in a front region of the arrangement comprising the front end of the electrodes reduced dimension, wherein a measure of the reduction is continuous and the arrangement has a lateral dimension at the distal end in the region of the photoconductive gap below 20 microns. Furthermore, the invention relates to a near field measurement setup. The invention also relates to a use of the near field measuring tip and / or the near field measuring structure.
机译:本发明涉及一种用于对电磁场的电部件进行场检测的光导测量头,该光导测量头具有至少一个载体和在该载体上侧向延伸的布置,该布置通过相互绝缘的第一电极和第二电极,通过第一电极和第二电极。光电导间隙的区域,第一电极和第二电极的侧向端部结构,相对于要检测的电磁场的电子成分的波长未进行波长调节,至少在电极的前部区域中包括电极的前端的装置减小尺寸,其中减小的措施是连续的,并且该装置在光导间隙的区域中在远端处具有小于20微米的横向尺寸。此外,本发明涉及一种近场测量装置。本发明还涉及近场测量尖端和/或近场测量结构的用途。

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