首页> 外国专利> Illumination lens for microlithography-projection exposure system, has optical element or additional optical element designed such that illumination light-beam angle distribution is influenced at object at two planes

Illumination lens for microlithography-projection exposure system, has optical element or additional optical element designed such that illumination light-beam angle distribution is influenced at object at two planes

机译:用于微光刻-投射曝光系统的照明透镜,具有光学元件或附加光学元件,其设计成使得照明光束角分布在两个平面上影响物体

摘要

The illumination lens (2) has an optical element (8) for producing a predetermined illumination light-beam angle distribution of a used radiation bundle at a place of an object (4) to be projected. The optical element or an additional optical element are designed such that the illumination light-beam angle distribution is influenced at the object at two planes, which are standing perpendicular on one another, in different measures by displacement of the optical element or the additional optical element. Independent claims are also included for the following: (1) a projection exposure system comprising an illumination lens (2) a method for manufacturing a micro-structured component.
机译:照明透镜(2)具有光学元件(8),该光学元件(8)用于在要投影的物体(4)的位置处产生用过的辐射束的预定照明光束角分布。光学元件或附加光学元件被设计成使得照明光束角分布在物体上在彼此垂直的两个平面上以不同的方式受到光学元件或附加光学元件的位移的影响。 。还包括以下方面的独立权利要求:(1)包括照明透镜的投影曝光系统(2)制造微结构部件的方法。

著录项

  • 公开/公告号DE102009014146A1

    专利类型

  • 公开/公告日2009-11-26

    原文格式PDF

  • 申请/专利权人 CARL ZEISS SMT AG;

    申请/专利号DE20091014146

  • 发明设计人 MAUL MANFRED;

    申请日2009-03-24

  • 分类号G03F7/20;G02B27/09;

  • 国家 DE

  • 入库时间 2022-08-21 18:28:21

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