首页> 外国专利> Lighting system for microlithographic-projection exposure system for illuminating object field in object level with illumination radiation, has two mirrors, where one mirror is flat mirror

Lighting system for microlithographic-projection exposure system for illuminating object field in object level with illumination radiation, has two mirrors, where one mirror is flat mirror

机译:用于用光刻辐射照亮物体水平的物场的微光刻投影曝光系统的照明系统,具有两个反射镜,其中一个反射镜是平面反射镜

摘要

The lighting system has two mirrors (5,7) where one of the mirrors is a flat mirror. Both the mirrors are operated under grazing incidence. The aperture of the illumination radiation at an object field (1) is greater than 0.05. A ray strikes on the former mirror under an incidence angle during operation of the microlithographic-projection exposure system. The incidence angle is larger than the incidence angle of another ray on the former mirror. The former ray strikes on the latter mirror under an incidence angle which is smaller than the incidence angle of the latter ray on the latter mirror.
机译:照明系统有两个镜子(5,7),其中一个镜子是平面镜子。两个镜子都在掠入射下工作。在物场(1)处的照明辐射的孔径大于0.05。在微光刻投影曝光系统的操作过程中,射线以入射角入射到前一个反射镜上。入射角大于前一镜上另一条光线的入射角。前者的光线以小于后者光线在后一反射镜上的入射角的入射角入射到后者的反射镜上。

著录项

  • 公开/公告号DE102009045096A1

    专利类型

  • 公开/公告日2010-10-07

    原文格式PDF

  • 申请/专利权人 CARL ZEISS SMT AG;

    申请/专利号DE20091045096

  • 发明设计人 BIELING STIG;

    申请日2009-09-29

  • 分类号G03F7/20;

  • 国家 DE

  • 入库时间 2022-08-21 18:28:13

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