首页> 外国专利> METHOD FOR MEASURING TILT OF IMAGING ELEMENT AND APPARATUS FOR MEASURING TILT OF IMAGING ELEMENT USING THE SAME

METHOD FOR MEASURING TILT OF IMAGING ELEMENT AND APPARATUS FOR MEASURING TILT OF IMAGING ELEMENT USING THE SAME

机译:成像元件倾斜度的测量方法和使用该元件的成像元件倾斜度的测量装置

摘要

PROBLEM TO BE SOLVED: To provide a method for measuring imaging element, to measure the tilt of an imaging element accurately, and to provide a measuring device using the same.;SOLUTION: The tilt measurement method is provided for measuring the tilt of the imaging element 110 with respect to an imaging device 100 that includes a lens barrel 120 in which an optical system 130 with positive power is disposed, and the imaging element 110 on which an optical image of a subject is formed via a lens barrel 120. The method includes: disposing an auxiliary lens 240 on the optical axis of the lens barrel 100 so that the focal point of the optical system 130 defined by incident light from the imaging element 110 coincides with the focal point of an auxiliary lens 240 defined by incident light from a subject; and measuring to determine whether light reflected by the imaging element 110 has been displaced or not with respect to measurement light incident on the optical system 130 via the auxiliary lens 240.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供一种用于测量成像元件的方法,以精确地测量成像元件的倾斜度,并提供一种使用该方法的测量装置。解决方案:提供了一种倾斜测量方法,用于测量成像的倾斜度。相对于成像装置100的成像元件110,成像装置100包括其中配置有具有正光焦度的光学系统130的镜筒120,以及经由镜筒120在其上形成对象的光学图像的成像元件110。包括:在镜筒100的光轴上布置辅助透镜240,使得由来自成像元件110的入射光限定的光学系统130的焦点与由来自成像元件110的入射光限定的辅助透镜240的焦点重合。课程;并进行测量以确定成像元件110反射的光是否已相对于通过辅助透镜240入射到光学系统130上的测量光发生了位移。

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