ANALYSIS PROCESSING DEVICE OF COMPOSITE MATERIAL, ANALYSIS PROCESSING METHOD OF COMPOSITE MATERIAL, AND PROGRAM FOR MAKING COMPUTER TO IMPLEMENT THE METHOD

摘要

PROBLEM TO BE SOLVED: To detect the information of a phase delay even if a plurality of kinds of polymers are in rubber states, when analyzing a composite material including the plurality of kinds of polymers by using an atomic force microscope.;SOLUTION: When analyzing the composite material by using the atomic force microscope, data of the phase delay of the composite material acquired by using a noncontact mode of the atomic force microscope are acquired under the condition of at least two set temperatures. Then, a phase image is generated based on data of the phase delay at each set temperature. Data of the phase delay of a second phase image generated under a condition of a second set temperature are acquired relative to a measuring position selected based on a first phase image generated under a condition of a first set temperature. The composite material is analyzed by using the acquired data of the phase delay. In this case, the first set temperature is positioned between some two glass transition temperatures among a plurality of glass transition temperatures carried by the plurality of kinds of polymers, and the second set temperature is higher than the two glass transition temperatures.;COPYRIGHT: (C)2011,JPO&INPIT