Technology and scan test system with high scan compression very RELATED APPLICATIONS This application is very high and a undefined value tolerated 'completely filed on October 21, 2008 An undefined value tolerance completely I claims priority to 61 / 107,239 U.S. Provisional Patent Application entitled scan compression '.

摘要

[Challenge] is to provide a technique and scan test system with high scan compression very undefined value tolerance completely. Scan compression is important in achieving a high shipment quality and reduce the cost and [MEANS FOR SOLVING PROBLEMS] scan test. The failure of the new type of complex design than ever, there is a need for high compression. However, I interfere with the effective compression density undefined value of (X) is increased. In the process of the scan compression, detection rate and complete compression very high is achieved for an undefined value of any density. Technology that has been described, can be fully integrated in the flow of (ATPG) automatic test pattern generation and (DFT) design for testability. As a result of using these techniques to industrial design, it was found that there are advantages and predictable constant compared to other methods. [Selection Figure Figure 2A