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Production method of the MIT element, and its MIT element which include the metal insulator transfer thin film and that metal insulator transfer thin film of the Ge basis

机译:包括金属绝缘体转移薄膜和Ge基金属绝缘体转移薄膜的MIT元件及其MIT元件的制造方法

摘要

Is not the composite material of 2 elements or more and it is formed from Ge unit element substance, it is possible to grow physically easily, the method of producing the MIT element, and the aforementioned MIT element which include the MIT thin film and the aforementioned MIT thin film of the Ge basis which can solve the problem regarding the secondary phase quality due to structural defect and the impurity which is included is offered. The aforementioned MIT element, the germanium on the baseplate and the aforementioned baseplate (Ge) is formed from unit element substance, discontinuous metal insulator transfer (MIT) includes with MIT thin film of the Ge basis which occurs and 2 where it touches to the MIT thin film of the aforementioned Ge basis thin film electrodes at least at specified transfer voltage, through aforementioned thin film electrode, features that the aforementioned discontinuity MIT occurs with voltage or the electric current which is impressed, in the MIT thin film of the aforementioned Ge basis.
机译:由Ge单元元素物质形成的非2元素以上的复合材料,可以容易地物理生长,包括MIT薄膜和上述的MIT元素的制造方法以及上述的MIT元素。提供了可以解决由于结构缺陷和所包含的杂质引起的关于二次相质量的问题的Ge基的MIT薄膜。上述MIT元素,基板上的锗和上述基板(Ge)由单位元素物质形成,不连续的金属绝缘体转移(MIT)包括MIT的Ge基薄膜和2与MIT接触的薄膜至少在指定的转移电压下,通过上述薄膜电极的上述Ge基薄膜电极的薄膜的特征在于,在上述Ge基的MIT薄膜中,伴随电压或施加的电流发生上述不连续MIT。 。

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