首页> 外国专利> ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, CHEMICAL AMPLIFICATION RESIST COMPOSITION, AND RESIST FILM AND PATTERN FORMING METHOD USING THE COMPOSITION

ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, CHEMICAL AMPLIFICATION RESIST COMPOSITION, AND RESIST FILM AND PATTERN FORMING METHOD USING THE COMPOSITION

机译:AC射线敏感或辐射敏感树脂组合物,化学增幅抗蚀剂组合物以及使用该组合物的抗蚀膜和图案形成方法

摘要

An actinic ray-sensitive or radiation-sensitive resin composition of the first invention includes (A1) an acid-decomposable resin, the resin containing three kinds of repeating units each having a specific structure, (B) a photo-acid generator and (C1) a 2-phenylbenzimidazole-based basic compound; an actinic ray-sensitive or radiation-sensitive resin composition of the second invention includes (A2) an acid-decomposable resin, (B) a photo-acid generator and (C2) 2-heteryl benzimidazole-based basic compound; a chemical amplification resist composition of the third invention includes (A3) an acid-decomposable resin, (B) a photo-acid generator and (C3) a benzimidazole-based basic compound having a sulfur atom-containing specific structure; and a resist film and a pattern forming method each use such a composition.
机译:第一发明的光化射线敏感或辐射敏感树脂组合物包括(A1)可酸分解的树脂,该树脂包含各自具有特定结构的三种重复单元,(B)光产酸剂和(C1) )基于2-苯基苯并咪唑的碱性化合物;第二发明的光化射线敏感性或放射敏感性树脂组合物包含(A2)酸分解性树脂,(B)光产酸剂和(C2)2-杂苯基苯并咪唑类碱性化合物。第三发明的化学增幅抗蚀剂组合物包含(A3)酸分解性树脂,(B)光产酸剂和(C3)具有含硫原子的特定结构的苯并咪唑系碱性化合物。抗蚀剂膜和图案形成方法均使用这样的组合物。

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