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Power transistor with improved high-side operating characteristics and reduced resistance and related apparatus and method

机译:具有改善的高端操作特性和减小的电阻的功率晶体管以及相关的装置和方法

摘要

A method includes forming a transistor device on a first side of a semiconductor-on-insulator structure. The semiconductor-on-insulator structure includes a substrate, a dielectric layer, and a buried layer between the substrate and the dielectric layer. The method also includes forming a conductive plug through the semiconductor-on-insulator structure. The conductive plug is in electrical connection with the transistor device. The method further includes forming a field plate on a second side of the semiconductor-on-insulator structure, where the field plate is in electrical connection with the conductive plug. The transistor device could have a breakdown voltage of at least 600V, and the field plate could extend along at least 40% of a length of the transistor device.
机译:一种方法包括在绝缘体上半导体结构的第一侧上形成晶体管器件。绝缘体上半导体结构包括衬底,介电层以及在衬底和介电层之间的掩埋层。该方法还包括通过绝缘体上半导体结构形成导电插塞。导电插头与晶体管器件电连接。该方法还包括在绝缘体上半导体结构的第二侧上形成场板,其中该场板与导电插头电连接。该晶体管器件可以具有至少600V的击穿电压,并且该场板可以沿着该晶体管器件的长度的至少40%延伸。

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