首页> 外国专利> SELF-ALIGNED WELL IMPLANT FOR IMPROVING SHORT CHANNEL EFFECTS CONTROL, PARASITIC CAPACITANCE, AND JUNCTION LEAKAGE

SELF-ALIGNED WELL IMPLANT FOR IMPROVING SHORT CHANNEL EFFECTS CONTROL, PARASITIC CAPACITANCE, AND JUNCTION LEAKAGE

机译:自对准井注入,可改善短通道效应控制,寄生电容和结泄漏

摘要

A method of forming a self-aligned well implant for a transistor includes forming a patterned gate structure over a substrate, including a gate conductor, a gate dielectric layer and sidewall spacers, the substrate including an undoped semiconductor layer beneath the gate dielectric layer and a doped semiconductor layer beneath the undoped semiconductor layer; removing portions of the undoped semiconductor layer and the doped semiconductor layer left unprotected by the patterned gate structure, wherein a remaining portion of the undoped semiconductor layer beneath the patterned gate structure defines a transistor channel and a remaining portion of the doped semiconductor layer beneath the patterned gate structure defines the self-aligned well implant; and growing a new semiconductor layer at locations corresponding to the removed portions of the undoped semiconductor layer and the doped semiconductor layer, the new semiconductor layer corresponding to source and drain regions of the transistor.
机译:一种形成用于晶体管的自对准阱注入物的方法,包括在包括栅极导体,栅极介电层和侧壁间隔物的衬底上形成图案化的栅极结构,该衬底包括在栅极介电层下方的未掺杂半导体层和衬底。在未掺杂半导体层下方的掺杂半导体层;去除未被图案化的栅极结构保护的未掺杂的半导体层和掺杂的半导体层的部分,其中图案化的栅极结构下方的未掺杂的半导体层的其余部分限定了晶体管沟道,以及图案化的下方的掺杂的半导体层的其余部分。门结构定义了自对准阱注入;在对应于未掺杂半导体层和掺杂半导体层的去除部分的位置处生长新的半导体层,该新的半导体层对应于晶体管的源极和漏极区域。

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