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Method and structure for avoiding hot carrier degradation and soft leakage damage to ESD protection circuit
Method and structure for avoiding hot carrier degradation and soft leakage damage to ESD protection circuit
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机译:避免热载流子退化和对ESD保护电路的软漏损的方法和结构
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摘要
In a ESD protection device, hot carrier degradation and soft leakage are reduced by introducing a dynamic driver that includes a RC circuit for keeping the triggering circuit of the ESD device in an on-state for a certain period of time. This allows the current through the ESD protection device to be reduced during the RC delay time.
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