Sample holder for X-ray microanalysis with scanning electron microscopy.

摘要

Sample holder for X-ray microanalysis with scanning electron microscopy.; The invention describes a new holder (1) for X-ray microanalysis avoids interference between signals of the sample and the signals of the sample holder itself (1), and comprising a base (2) on which columns are supported (3a , 3b, 3c) supporting a structure (4) support, preferably a cylinder whose upper end has a cover (5) with a central hole (6) on which a grid containing the sample is placed.