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Optical measuring apparatus, optical level measuring system and optical level measuring method

机译:光学测量设备,光学水平测量系统和光学水平测量方法

摘要

This invention concerns measuring optical power in a passive optical network (PON) employing time division multiplexing (TDM). At an optical line terminal (OLT), the optical levels of signals transmitted froth multiple optical network units (ONU)s is measured. In ordinary operation each ONU is assigned a band permission time in which it can transmit data to the OLT. However, the duration of the band permission time (left hand 50, Fig. 2) may be shorter than the time required to make an optical level measurement (51, Fig. 2). If this is the case, the measurement time period is extended by assigning an additional dedicated band (right hand 50, Fig. 2) to the affected ONU immediately before or after the band permission time.
机译:本发明涉及在采用时分复用(TDM)的无源光网络(PON)中测量光功率。在光线路终端(OLT),测量从多个光网络单元(ONU)传输的信号的光电平。在普通操作中,每个ONU被分配一个频带允许时间,在该时间内它可以向OLT发送数据。但是,频带允许时间(图2的左手50)的持续时间可以短于进行光学水平测量(图2的51)所需的时间。如果是这种情况,则通过在频段允许时间之前或之后立即向受影响的ONU分配一个附加的专用频段(图2的右手50)来延长测量时间。

著录项

  • 公开/公告号AU2010202648A1

    专利类型

  • 公开/公告日2011-01-20

    原文格式PDF

  • 申请/专利权人 NEC CORPORATION;

    申请/专利号AU20100202648

  • 发明设计人 YASUKO MIKAMI;

    申请日2010-06-25

  • 分类号H04B10/07;H04B10/079;H04B10/27;H04B10/272;H04L12/44;

  • 国家 AU

  • 入库时间 2022-08-21 18:01:11

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