Provided is a silicon purity measuring instrument which prevents silicon from being contaminated with metals and measures the purity inside of the silicon. A silicon sorting apparatus and a silicon purity measuring method are also provided.A silicon purity measuring instrument (10) is provided with: an inspecting table; a magnetic field generator (14) which generates a magnetic field for measurement such that a magnetic flux permeates inside of the silicon disposed on the inspecting table; and a determining section (36) which determines the attenuation degree of the magnetic field after instantaneously interrupting the magnetic field for measurement. The purity inside of the silicon is identified based on the attenuation degree determined by the determining section (36).
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