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POWER SUPPLY VOLTAGE DETERMINATION METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT AND POWER SUPPLY VOLTAGE CONTROL SYSTEM FOR SEMICONDUCTOR INTEGRATED CIRCUIT
POWER SUPPLY VOLTAGE DETERMINATION METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT AND POWER SUPPLY VOLTAGE CONTROL SYSTEM FOR SEMICONDUCTOR INTEGRATED CIRCUIT
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机译:半导体集成电路的电源电压确定方法及半导体集成电路的电源电压控制系统
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摘要
Provided are a power supply voltage determination method for a semiconductor integrated circuit and a power supply voltage control system for the semiconductor integrated circuit. In the power supply voltage determination method for a semiconductor integrated circuit, a power supply voltage of the integrated circuit is determined as follows: using a plurality of cell libraries constituting the semiconductor integrated circuit and process variation information, the characteristic variation of each cell included in the cell libraries is statistically analyzed; the sensitivities and mutual dependency of a plurality of parameters causing the characteristic variation of the delay time of the each cell are calculated; a characteristic monitoring circuit is mounted and a database is created in which the delay times of the all signal transmission paths in the semiconductor integrated circuit are stored; a map is created that indicates a relationship between the plurality of parameters causing the characteristic variation and the optimum power supply voltage of the semiconductor integrated circuit; using the inverse function of the response surface of a cell constituting a plurality of delay circuits, the plurality of parameters causing the characteristic variation are estimated from the output of the characteristic monitoring circuit; and the power supply voltage of the semiconductor integrated circuit is determined using the map and the estimated plurality of parameters causing the characteristic variation.
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