首页> 外国专利> POWER SUPPLY VOLTAGE DETERMINATION METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT AND POWER SUPPLY VOLTAGE CONTROL SYSTEM FOR SEMICONDUCTOR INTEGRATED CIRCUIT

POWER SUPPLY VOLTAGE DETERMINATION METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT AND POWER SUPPLY VOLTAGE CONTROL SYSTEM FOR SEMICONDUCTOR INTEGRATED CIRCUIT

机译:半导体集成电路的电源电压确定方法及半导体集成电路的电源电压控制系统

摘要

Provided are a power supply voltage determination method for a semiconductor integrated circuit and a power supply voltage control system for the semiconductor integrated circuit. In the power supply voltage determination method for a semiconductor integrated circuit, a power supply voltage of the integrated circuit is determined as follows: using a plurality of cell libraries constituting the semiconductor integrated circuit and process variation information, the characteristic variation of each cell included in the cell libraries is statistically analyzed; the sensitivities and mutual dependency of a plurality of parameters causing the characteristic variation of the delay time of the each cell are calculated; a characteristic monitoring circuit is mounted and a database is created in which the delay times of the all signal transmission paths in the semiconductor integrated circuit are stored; a map is created that indicates a relationship between the plurality of parameters causing the characteristic variation and the optimum power supply voltage of the semiconductor integrated circuit; using the inverse function of the response surface of a cell constituting a plurality of delay circuits, the plurality of parameters causing the characteristic variation are estimated from the output of the characteristic monitoring circuit; and the power supply voltage of the semiconductor integrated circuit is determined using the map and the estimated plurality of parameters causing the characteristic variation.
机译:提供一种用于半导体集成电路的电源电压确定方法和用于该半导体集成电路的电源电压控制系统。在用于半导体集成电路的电源电压确定方法中,如下确定集成电路的电源电压:使用构成半导体集成电路的多个单元库和处理变化信息,包括在其中的每个单元的特性变化。对细胞库进行统计分析;计算导致每个小区的延迟时间的特性变化的多个参数的灵敏度和相互依赖性;安装特性监视电路并创建数据库,其中存储半导体集成电路中所有信号传输路径的延迟时间;产生表示导致特性变化的多个参数与半导体集成电路的最佳电源电压之间的关系的映射图;利用构成多个延迟电路的单元的响应面的反函数,从特性监视电路的输出推定引起特性变化的多个参数。使用所述映射图和所估计的引起所述特性变化的多个参数来确定所述半导体集成电路的电源电压。

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