首页> 外国专利> A METHOD, AN APPARATUS, CHEMICAL KITS AND A PROGRAM FOR ANALYZING THE DISTRIBUTION OF DIFFERENT TYPES OF NANOSTRUCTURES AND/OR SUB-NANOSTRUCTURES IN A SAMPLE

A METHOD, AN APPARATUS, CHEMICAL KITS AND A PROGRAM FOR ANALYZING THE DISTRIBUTION OF DIFFERENT TYPES OF NANOSTRUCTURES AND/OR SUB-NANOSTRUCTURES IN A SAMPLE

机译:用于分析样品中不同类型的纳米结构和/或亚纳米结构的分布的方法,装置,化学试剂盒和程序

摘要

A method for analyzing the distribution of different types of nanostructures and/or sub-nanostructures in a sample, comprising the steps of - adding at least first and second fluorescent agents to the sample - irradiating the sample and the agents with light - measuring the emission spectra of the sample and agents over a range of wavelengths characteristic for the different types of said structures and agents and - analyzing the spectra to identify the distribution from the spectral responses. Also disclosed and claimed are corresponding apparatuses, a kit for establishing a distribution of different types of nanostructures and/ or sub-nanostructures in a sample, a laboratory workstation and a program carrier with related program.
机译:一种用于分析样品中不同类型的纳米结构和/或亚纳米结构的分布的方法,包括以下步骤:-向样品中添加至少第一和第二荧光剂-用光照射样品和试剂-测量发射在不同类型的所述结构和试剂的特征波长范围内的样品和试剂的光谱,以及-分析光谱以从光谱响应中识别出分布。还公开并要求保护的是相应的装置,用于在样品中建立不同类型的纳米结构和/或亚纳米结构的分布的试剂盒,实验室工作站和具有相关程序的程序载体。

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