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Electron Spectrometer using Bending Magnet Capable of Focusing Electron Path According to Electron Beam Energy Distribution

机译:使用能根据电子束能量分布聚焦电子路径的弯曲磁铁的电子能谱仪

摘要

The present invention existing "divergence of the beam is small," under the assumption that the electronic path to the square shape bending You can measure the energy of the electron beam to an accuracy much higher than the energy measurement accuracy of the electron beam through a magnet, a triangular shape which can easily accurately measure the energy to less than 10MeV electron emitting unit according to the degree of bending the path of the magnet It relates to a spectrometer with an electron beam. Using this technique, can be optionally applied to the technique to use only a desired electron beam from the electron beam having a large energy band energy to.
机译:本发明存在的“电子束的发散很小”的假设是,电子弯曲到正方形的电子路径可以通过如下方式测量电子束的能量,其精度远高于电子束的能量测量精度。磁体,其形状为三角形,能够根据磁体的弯曲路径而容易地准确地测量能量至10MeV以下的电子发射单元。涉及一种具有电子束的光谱仪。使用该技术,可以可选地应用于仅使用来自具有大的能带能量的电子束的期望的电子束的技术。

著录项

  • 公开/公告号KR100996142B1

    专利类型

  • 公开/公告日2010-11-24

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20080124575

  • 发明设计人 김재훈;김종욱;유승훈;

    申请日2008-12-09

  • 分类号H01J49/44;H01J37/252;

  • 国家 KR

  • 入库时间 2022-08-21 17:52:57

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